| International Journal of Advanced Applied Physics Research (Volume 1 Issue 1) |
| Advance in the Analysis Models for Characterizing Multi-Layered Interdigital Capacitors |
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Pages 1-8
Kwong Wai Mak and Jianhua Hao
DOI: http://dx.doi.org/10.15379/2408-977X.2014.01.01.1
Published: 28 August 2014 |
| Abstract |
| The performances of multi-layered interdigital capacitors are commonly simulated by computer software. However, it is the time-consuming process. Besides simulations, the analytic models with closed form expressions provide convenient methods in particular usages, such as characterizing ferroelectric materials. This article briefly reviews the development in the expressions for analytic models. We provide an overview of partial capacitance technique and conformal mapping technique, which are used for formulating expressions. In addition, three common models used these techniques are presented. The differences of models and applications are also discussed. |
| Keywords |
| Device modeling, Interdigital capacitors, Conformal mapping, Ferroelectric devices. |
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