Influence of Stress Relaxation on the Magnetization Process of Hitperm-Type Glass-Coated Microwires
DOI:
https://doi.org/10.15379/2408-977X.2014.01.02.2Keywords:
Glass-coated microwires, Nanocrystalline microstructure, Switching field.Abstract
The remagnetization process of most amorphous and nanocrystalline glass-coated microwires with positive magnetostriction coefficient occurs through the single and large Barkhausen jump. This article encompasses a study on the magnetization process of thin Hitperm-type glass coated microwires. The complex stress distribution inside these microwires enables us to investigate the influence of; the measuring frequency, applied tensile stresses, as well as current annealing, and conventional annealing at wide range of temperatures. A systematic elucidations have been discussed in the framework of the microwire's geometries and the shape anisotropy that arises during its fabrication process, with the aim to provide an assessment of the criteria for selecting the necessary conditions to be designed in high-performance sensors.
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